Scaling of surface roughness in evaporated calcium fluoride films

被引：19

作者：

Mbise, GW ^{[1
]}

Niklasson, GA ^{[1
]}

Granqvist, CG ^{[1
]}

机构：

[1] UNIV UPPSALA,DEPT TECHNOL,S-75121 UPPSALA,SWEDEN

来源：

SOLID STATE COMMUNICATIONS | 1996年 / 97卷 / 11期

关键词：

thin films; surfaces and interfaces;

D O I：

10.1016/0038-1098(95)00749-0

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The surface roughness of evaporated CaF2 films was studied by Atomic Force Microscopy. Scaling exponents for kinetic roughening, alpha and beta, were found to be close to 1 and 1/2, respectively. These values were interpreted in terms of unstable growth of columnar structures due to Schwoebel barriers for diffusing atoms at steps in the surface.

引用

收藏

页码：965 / 969

页数：5

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