Empirical Evidence of Reliability Growth in Large-Scale Networks

被引:3
作者
Snow A.P. [1 ,2 ,3 ,4 ,5 ]
Weiss M.B.H. [1 ,2 ,6 ,7 ,8 ,9 ]
机构
[1] Dept. of Info. Sci. and Telecom., School of Information Sciences, University of Pittsburgh, Pittsburgh, PA 15260
[2] Coopers Lybrand, Netwk. Mgmt. Inc., ConTel, Network Analysis Corporation
关键词
Fault analysis; FTS2000; Network reliability; NHPP;
D O I
10.1023/A:1018774912261
中图分类号
学科分类号
摘要
An analysis of major telecommunications outages experienced by a nation-wide network is presented. The purpose of this analysis is to examine the utility of Nonhomogeneous Poisson Process (NHPP) models in characterizing large-scale network failure behavior. The analysis not only shows the suitability of this theory, but also demonstrates the reliability growth of these network services for the time period studied. Modeling network failures as a NHPP also allows the decomposition of the failure intensity into individual hazards, providing insights into failure causes. In addition, network reliability can be characterized in classical probabilistic terms. The usefulness and limitations of this technique are discussed.
引用
收藏
页码:197 / 213
页数:16
相关论文
共 8 条
[1]  
Snow A., Weiss M., Network staffing decisions based upon network failure data, Proceedings Fourth International Conference on Telecommunication Systems: Modeling and Analysis, pp. 379-384, (1996)
[2]  
Clarification of Interim Outage Reporting, (1992)
[3]  
Federal Communications Commission, (1992)
[4]  
Duane J.T., Learning curve approach to reliability monitoring, IEEE Transactions on Aerospace, 2, pp. 563-566, (1963)
[5]  
Leemis L.M., Reliability: Probabilistic Models and Statistical Methods, (1995)
[6]  
Neter J., Wasserman W., Kutner M., Applied Linear Statistical Models, Third Edition, (1990)
[7]  
Xie M., Zhao M., On some reliability growth models with simple graphical interpretations, Microelectronics Reliability, 33, pp. 149-167, (1993)
[8]  
Yamada S., Osaki S., Reliability growth models for hardware and software systems based on nonhomogeneous poisson processes: A survey, Microelectronics Reliability, 23, pp. 91-112, (1983)