Morphologies and growth mechanisms of aluminum nitride whiskers by SHS method - Part 2

被引:30
作者
Guojian J. [1 ]
Hanrui Z. [1 ]
Jiong Z. [1 ]
Meiling R. [1 ]
Wenlan L. [1 ]
Fengying W. [1 ]
Baolin Z. [1 ]
机构
[1] Department of High Temperature Structural Ceramics, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 200050
关键词
Polymer; Aluminum; Microstructure; Microscopy; Electron Microscopy;
D O I
10.1023/A:1004732314397
中图分类号
学科分类号
摘要
The high resolution electron microscopy was used to investigate the microstructure of AlN whiskers. The growth mechanisms of AlN whiskers were VLS and VS mechanism. The phenomenon of stacking fault was analyzed. Moreover, the growth mechanism of dendritic crystal was proposed.
引用
收藏
页码:63 / 69
页数:6
相关论文
共 11 条
[1]  
Levitt A.P., Whisker Technology, (1970)
[2]  
Evans C.C., Whiskers, (1972)
[3]  
Caceres P.G., J. Amer. Ceram. Soc., 77, 4, pp. 977-983, (1994)
[4]  
Miao W., Wu Y., Zhou H., J. Mater. Sci., 32, pp. 1969-1975, (1997)
[5]  
Zhou H., Cheng H., Liu Y., Wu Y., J. Inorganic Mater., 13, 4, pp. 477-483, (1998)
[6]  
Drum C.M., Mitcheu J.W., Appl. Phys. Lett., 4, pp. 164-165, (1964)
[7]  
Shyne J.J., Milewski J.V.
[8]  
Milewki J.V., Gac F.D., Petrovic J.J., Skaggs S.R., J. Mater. Sci., 20, pp. 1160-1166, (1985)
[9]  
Furuta N., Zaiyro Kagaku, 9, pp. 2-10, (1972)
[10]  
Kato A., Tamari N., J. Cryst. Growth, 49, (1989)