Applications of neutron reflectivity measurements to nanoscience: Thin films and interfaces

被引：3

作者：

John F. Ankner ^{[
]}

Hartmut Zabel ^{[
]}

机构：

[1] Spallation Neutron Source, Oak Ridge National Laboratory, Oak Ridge, TN

[2] Ruhr-Universitat Bochum, Bochum

来源：

MRS Bulletin | 2003年 / 28卷 / 12期

关键词：

Nanoscale; Neutron reflectivity; Neutron scattering; Thin films;

D O I：

10.1557/mrs2003.255

中图分类号：

学科分类号：

摘要：

Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir-Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10-100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science.

引用

页码：918 / 922

页数：4

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