Test Points Selection for Analog Fault Dictionary Techniques

被引：9

作者：

Chenglin Yang

Shulin Tian

Bing Long

机构：

[1] University of Electronic Science and Technology of China,School of Automation engineering

来源：

Journal of Electronic Testing | 2009年 / 25卷

关键词：

Test points selection; Analog fault dictionary; Integer-Coded fault wise table; Test points selection strategy; Test points selection criterion;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The test points selection problem for analog fault dictionary is researched extensively in many literatures. Various test points selection strategies and criteria for Integer-Coded fault wise table are described and compared in this paper. Firstly, the construction method of Integer-Coded fault wise table for analog fault dictionary is described. Secondly, theory and algorithms associated with these strategies and criteria are reviewed. Thirdly, the time complexity and solution accuracy of existing algorithms are analyzed and compared. Then, a more accurate test points selection strategy is proposed based on the existing strategies. Finally, statistical experiments are carried out and the accuracy and efficiency of different strategies and criteria are compared in a set of comparative tables and figures. Theoretical analysis and statistical experimental results given in this paper can provide an instruction for coding an efficient and accurate test points selection algorithm easily.

引用

页码：157 / 168

页数：11

共 27 条

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