Mixed-Mode BIST Using Embedded Processors

被引：1

作者：

Sybille Hellebrand

Hans-Joachim Wunderlich

Andre Hertwig

机构：

[1] University of Stuttgart,Division of Computer Architecture

来源：

Journal of Electronic Testing | 1998年 / 12卷

关键词：

BIST; random pattern testing; deterministic BIST; embedded systems;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not completely random pattern testable, the test programs have to generate deterministic patterns after random testing. Usually the random test part of the program requires long run times whereas the part for deterministic testing has high memory requirements.

引用

页码：127 / 138

页数：11

共 15 条

[1]

Barzilai Z.(1983)Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing IEEE Trans. on Comp. C-32 190-194

[2]

Coppersmith D.(1995)Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers IEEE Trans. on Comp. 44 223-233

[3]

Rosenberg A.L.(1989)Cellular Automata-Based Pseudorandom Number Generators for Built-In Self-Test IEEE Trans. on CAD 8 842-859

[4]

Hellebrand S.(1992)A Multiple Seed Linear Feedback Shift Register IEEE Trans. on Comp. 41 250-252

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