Fabrication of high aspect ratio nano gratings using SR lithography

被引:3
作者
Fumiki Kato
Shinya Fujinawa
Yigui Li
Susumu Sugiyama
机构
[1] Ritsumeikan University,Department of Micro System Technology
来源
Microsystem Technologies | 2007年 / 13卷
关键词
PMMA; Diffraction Efficiency; Mask Pattern; Direct Writing; Diffractive Optical Element;
D O I
暂无
中图分类号
学科分类号
摘要
In this paper, the fabrication technique for high-aspect-ratio diffractive optical element (DOE) is introduced. The 500 nm-width and 1,000 nm-width line-and-space pattern has been successfully fabricated. It was fabricated by synchrotron radiation (SR) lithography for the application of nano gratings, and poly-methylmethacrylate (PMMA) was used as X-ray resist. The nanoscale grating with the aspect ratio of 4.4 and 2.2 was achieved. So far, there are a number of reported techniques for fabrication of DOEs yet the height of those gratings is not sufficient. Therefore, we have attempted to investigate the fabrication of high-aspect-ratio nano gratings by a high-resolution X-ray lithography using SR source at Ritsumeikan University, Japan. Nevertheless, the evaluation of various factors influencing the high-aspect-ratio structure fabricated by our recommended technique is discussed. So far the fabricating process, such as, proximity gap of exposure, the exposure dosage, and the development time have been optimized to fabricate the gratings.
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页码:221 / 225
页数:4
相关论文
共 2 条
[1]  
Shank M(1994)Fabrication of multi-level phase gratings using focused ion beam milling and electron beam lithography OSA Tech Dig 11 302-306
[2]  
Yokomori K(1984)Dielectric surface-relief gratings with high diffraction efficiency Appl Opt 23 2303-2310