Known Good Die

被引:1
作者
Larry Gilg
机构
[1] MCC,
来源
Journal of Electronic Testing | 1997年 / 10卷
关键词
known good die; KGD; chip scale (size) package; CSP; burn-in; multi-chip module (MCM); wafer probe; membrane probe card; buckling beam probe card; KGD carrier;
D O I
暂无
中图分类号
学科分类号
摘要
Advances in reducing size and increasing functionality of electronics have been due primarily to the shrinking geometries and increasing performance of integrated circuit technologies. Recently, development efforts aimed at reducing size and increasingfunctionality have focused on the first level of the electronicpackage. The result has been the development of multichip packaging,technologies in which bare IC chips are mounted on a single high density substrate that serves to “package” thechips, as well as interconnect them. A number of benefits accruebecause of multichip packaging, namely, increased chip density,space savings, higher performance, and less weight. Therefore, thesetechnologies are attractive for today's light weight, portable, highperformance electronic equipment and devices.
引用
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页码:15 / 25
页数:10
相关论文
共 5 条
[1]  
Hagge J.K.(1992)HighYield Assembly of Multichip Modules through Known-Good IC's and Effective Test Strategies Proc. of the IEEE 80 1965-1994
[2]  
Agner R.J.(1983)Facing the Headaches of Early Failures: A State-of-the-Art Review of Burn-In Decisions Proceedings of the IEEE 71 1257-1266
[3]  
Kuo W.(1986)MOS VLSI Reliability and Yield Trends Proceedings of the IEEE 74 1715-1729
[4]  
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