Constant-step stress accelerated life test of VFD under Weibull distribution case

被引：8

作者：

Zhang J.-P. ^{[1
]}

Geng X.-M. ^{[2
]}

机构：

[1] Department of Information and Electronic Engineering, Zhejiang University

[2] Faculty of Computer and Information Engineering, Shanghai University of Electric Power

来源：

Journal of Zhejiang University-SCIENCE A | 2005年 / 6卷 / 7期

关键词：

Accelerated life test; Average life; Constant-step; Vacuum Fluorescent Display; Weibull;

D O I：

10.1631/jzus.2005.A0722

中图分类号：

学科分类号：

摘要：

Constant-step stress accelerated life test of Vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, and Least Square Method (LSM) for estimating Weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows Weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life.

引用

页码：722 / 727

页数：5

共 5 条

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