Microstructure and properties of solution deposited, Nb-doped PZT thin films

被引:10
作者
Es-Souni M. [1 ]
Piorra A. [1 ]
Solterbeck C.-H. [1 ]
Iakovlev S. [1 ]
Abed M. [1 ]
机构
[1] University of Applied Sciences, Inst. of Mat. and Surface Technology, Kiel
关键词
Electrical properties; Nb-doping; PZT; Seed layer; Solution deposition;
D O I
10.1023/A:1022806506193
中图分类号
学科分类号
摘要
Nb doped PZT films with Nb concentrations of 0, 5, 8 and 12 mol% are being processed via chemical solution deposition on platinized Silicon substrates. An original processing route including seed layer and additional PbO coating is presented whereby homogeneous, pyrochlore free microstructures with 111/100 texture are obtained. The temperature dependence of the dielectric constant shows diffuse peaks corresponding to the paraelectric to ferroelectric transition. The transition temperature is found to decrease from 325°C to 220°C with increasing Nb content. Nb is however found to lead to a substantial increase in the dielectric constant in comparison to non-doped PZT. The dependence of the dielectric constant on DC bias field is also reported. Strong asymmetries towards positive values both in the values of the dielectric constant and coercive fields are obtained at room temperature, and become replenished at 100°C. This is interpreted in terms of space charge effects on the pinning of domain walls. Furthermore, the loss tangent shows a relaxation peak which shifts to higher frequencies with increasing Nb content, and suggests that Nb-doping affects the dielectric properties of the interfacial layer. Finally, Nb addition is found to lead to slant hysteresis loops with lower remnant polarization and coercive field.
引用
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页码:125 / 135
页数:10
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