Single-shot terahertz-field-driven X-ray streak camera

被引：258

作者：

Fruehling, Ulrike ^{[2
]}

Wieland, Marek ^{[1
]}

Gensch, Michael ^{[2
,3
]}

Gebert, Thomas ^{[1
]}

Schuette, Bernd ^{[1
]}

Krikunova, Maria ^{[1
]}

Kalms, Roland ^{[1
]}

Budzyn, Filip ^{[1
]}

Grimm, Oliver ^{[1
,4
]}

Rossbach, Joerg ^{[1
]}

Ploenjes, Elke ^{[2
]}

Drescher, Markus ^{[1
]}

机构：

[1] Univ Hamburg, Inst Expt Phys, D-22761 Hamburg, Germany

[2] DESY, D-22603 Hamburg, Germany

[3] Helmholtz Zentrum Berlin, D-12489 Berlin, Germany

[4] ETH, Inst Teilchenphys, CH-8093 Zurich, Switzerland

来源：

NATURE PHOTONICS | 2009年 / 3卷 / 09期

关键词：

FREE-ELECTRON LASER; EXTREME-ULTRAVIOLET; PULSES; RADIATION; LIGHT;

D O I：

10.1038/NPHOTON.2009.160

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A few-femtosecond X-ray streak camera has been realized using a pump-probe scheme that samples the transient response of matter to ionizing soft X-ray radiation in the presence of an intense synchronized terahertz field. Borrowing its concept from attosecond metrology, the femtosecond X-ray streak camera fills the gap between conventional streak cameras with typical resolutions of hundreds of femtoseconds and streaking techniques operating in the sub-femtosecond regime. Its single-shot capability permits the duration and time structure of individual X-ray pulses to be determined. For several classes of experiments in time-resolved spectroscopy, diffraction or imaging envisaged with novel accelerator-and laser-based short-pulse X-ray sources this knowledge is essential, but represents a major challenge to X-ray metrology. Here we report on the single-shot characterization of soft X-ray pulses from the free-electron laser facility FLASH.

引用

页码：523 / 528

页数：6

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