QUANTITATIVE INTENSITY MEASUREMENTS USING A SOFT-X-RAY STREAK CAMERA

被引：12

作者：

KAUFFMAN, RL

STRADLING, GL

ATTWOOD, DT

MEDECKI, H

机构：

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1983年 / 19卷 / 04期

关键词：

D O I：

10.1109/JQE.1983.1071907

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：616 / 621

页数：6

共 17 条

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