To reduce troubles and measuring errors during high-voltage impulse testing, modern test plants often are provided with metal plates or grids placed in or on the floor and used as the return lead for the currents on the ground side. It is shown by a theoretical analysis that such a plate or grid constitutes a considerable improvement over the conventional conductors earlier used as ground returns. It is also shown that the difference in performance of a grid and a plate is rather small if the type of grid is properly chosen. This may considerably reduce the costs of the ground return systems in large test plants. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.
