STUDY OF XPS PHOTOEMISSION OF SOME GADOLINIUM COMPOUNDS

被引：163

作者：

RAISER, D

DEVILLE, JP

机构：

[1] Groupe Surfaces-Interfaces, UM 380046 - IPCMS, 67070 Strasbourg Cedex

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1991年 / 57卷 / 01期

关键词：

D O I：

10.1016/0368-2048(91)85016-M

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

XPS photoemission lines from GdF3, GdCl3, Gd2 (SO4)3, Gd(NO3)3, Gd2O3 and metallic Gd have been measured in order to determine their chemical shifts. The atomic sensitivity factors of Gd3d and Gd4d transitions have been determined along with Auger parameters wherever possible.

引用

页码：91 / 97

页数：7

共 10 条

[1]

BRUNDLE CR, 1977, ELECTRON SPECTROSCOP, V1

[2]

CARLSON TA, 1978, XRAY PHOTELECTRON SP, V12

[3] APPRAISAL OF A NEW CHARGE CORRECTION METHOD IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].