BER SENSITIVITY OF OFDM SYSTEMS TO CARRIER FREQUENCY OFFSET AND WIENER PHASE NOISE

被引：1178

作者：

POLLET, T

VANBLADEL, M

MOENECLAEY, M

机构：

[1] Communication Engineering Lab., University of Ghent, B-9000, Ghent

来源：

IEEE TRANSACTIONS ON COMMUNICATIONS | 1995年 / 43卷 / 2-4期

关键词：

OFDM; WIENER NOISE; CARRIER FREQUENCY OFFSET; BER DEGRADATION;

D O I：

10.1109/26.380034

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this contribution the transmission of M-PSK and M-QAM modulated orthogonal frequency division multiplexed (OFDM) signals over an additive white Gaussian noire (AWGN) channel is considered. The degradation of the bit error rate (BER), caused by the presence of carrier frequency offset and carrier phase noise is analytically evaluated. It is shown that for a given BER degradation, the values of the frequency offset and the linewidth of the carrier generator that are allowed for OFDM are orders of magnitude smaller than for single carrier systems carrying the same bit rate.

引用

页码：191 / 193

页数：3

共 6 条

[1] MULTICARRIER MODULATION FOR DATA-TRANSMISSION - AN IDEA WHOSE TIME HAS COME [J].