WAVELENGTH SENSITIVITY OF BACKSCATTERING

被引：9

作者：

GEORGE, N ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

OPTICS COMMUNICATIONS | 1976年 / 16卷 / 03期

关键词：

D O I：

10.1016/0030-4018(76)90009-2

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：328 / 333

页数：6

共 10 条

[1]

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[6]

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OPTICS COMMUNICATIONS, 1974, 12 (01) :75-78

[8] ROUGHNESS DEPENDENCE OF PARTIALLY DEVELOPED, MONOCHROMATIC SPECKLE PATTERNS [J].

PEDERSEN, HM .

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[9] SURFACE-ROUGHNESS MEASUREMENT USING WHITE-LIGHT SPECKLE [J].

SPRAGUE, RA .

APPLIED OPTICS, 1972, 11 (12) :2811-&

[10] RELATION BETWEEN STATISTICAL PROPERTIES OF SURFACE-ROUGHNESS AND AVERAGED SPECKLE INTENSITY IN DIFFRACTION FIELD [J].

TAKAI, N .

OPTICS COMMUNICATIONS, 1975, 14 (01) :24-29

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