PULSE MEASUREMENTS FOR THE INVESTIGATION OF FAST ELECTRONIC AND IONIC PROCESSES AT THE ELECTRODE ELECTROLYTE INTERFACE

The electrochemical properties of the interface electrode/electrolyte are often determined by thin surface layers. The formation of barriere type oxides in the range of 5 nm to 25 nm on the valve metals Al, Hf, Nb, Ta, Ti, and Zr is taken as an example. They were investigated by current transients of potentiostatic pulses (PPT) and by instationary impedance spectroscopy. The different processes of charging of the oxide capacity dielectric relaxation of the oxide formation of a mobile ionic space charge high field oxide growth corrosion are separated. Contradictory electrochemical investigations of the last 60 years are discussed.