SOME NOTES ON WEAR-DEPENDENT SYSTEMS

被引:2
作者
FINKELSTEIN, MS
机构
[1] Laboratory of Reliability, Electropribor Institute, Malaya, 197046 St Petersburg
来源
MICROELECTRONICS AND RELIABILITY | 1993年 / 33卷 / 02期
关键词
4;
D O I
10.1016/0026-2714(93)90471-A
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A system is subject to random failure through use. The key parameter of degradation. w, is measured continuously. A w-parametrization of the main reliability factors is introduced, simplifying the usual analyses. The limits of this approach are discussed.
引用
收藏
页码:115 / 117
页数:3
相关论文
共 4 条
[1]   GAMMA WEAR PROCESS [J].
ABDELHAMEED, M .
IEEE TRANSACTIONS ON RELIABILITY, 1975, R 24 (02) :152-153
[2]   SHOCK MODELS AND WEAR PROCESSES [J].
ESARY, JD ;
MARSHALL, AW ;
PROSCHAN, F .
ANNALS OF PROBABILITY, 1973, 1 (04) :627-649
[3]  
FINKELSTEIN MS, 1991, RELIABILITY SYSTEMS
[4]   OPTIMAL WEAR-LIMIT REPLACEMENT WITH WEAR-DEPENDENT FAILURES [J].
PARK, KS .
IEEE TRANSACTIONS ON RELIABILITY, 1988, 37 (03) :293-294