机构:Laboratory of Reliability, Electropribor Institute, Malaya, 197046 St Petersburg
FINKELSTEIN, MS
机构:
[1] Laboratory of Reliability, Electropribor Institute, Malaya, 197046 St Petersburg
来源:
MICROELECTRONICS AND RELIABILITY
|
1993年
/
33卷
/
02期
关键词:
4;
D O I:
10.1016/0026-2714(93)90471-A
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A system is subject to random failure through use. The key parameter of degradation. w, is measured continuously. A w-parametrization of the main reliability factors is introduced, simplifying the usual analyses. The limits of this approach are discussed.