EMS - A SOFTWARE PACKAGE FOR ELECTRON-DIFFRACTION ANALYSIS AND HREM IMAGE SIMULATION IN MATERIALS SCIENCE

被引：1908

作者：

STADELMANN, PA

机构：

[1] Ecole Polytechnique Federale, Lausanne, Switz, Ecole Polytechnique Federale, Lausanne, Switz

来源：

关键词：

D O I：

10.1016/0304-3991(87)90080-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

MATERIALS SCIENCE

引用

页码：131 / 145

页数：15

共 36 条

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[8] FIELDS PM, 1978, ACTA CRYSTALLOGR A, V34, P102
[9] FRAUNDORF P, 1981, ULTRAMICROSCOPY, V6, P227, DOI 10.1016/S0304-3991(81)80158-1
[10] STEREO ANALYSIS OF ELECTRON-DIFFRACTION FROM KNOWN CRYSTALS
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