IMAGING OF A SURFACE ALLOY WITH ENERGY-DEPENDENT PHOTOELECTRON HOLOGRAPHY

被引:56
作者
TOBIN, JG
WADDILL, GD
LI, H
TONG, SY
机构
[1] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201
[2] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201
关键词
D O I
10.1103/PhysRevLett.70.4150
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Fourier transformation of experimental energy-dependent photoelectron diffraction data has been used to produce an essentially artifact-free image of a surface alloy. This direct method, based upon the intersection off contour arcs associated with each measurement direction, can provide vectorial atomic positions with atomic resolution. A rapid data collection mode was introduced. Surface structural sensitivity was confirmed by comparison with multiple-scattering simulations. The previously ambiguous surface geometry of c(2x2)Au/Cu(001) has been determined, with clear, non-model-dependent discrimination of the surface alloy over the overlayer structure.
引用
收藏
页码:4150 / 4153
页数:4
相关论文
共 42 条
[1]   GEOMETRY OF (2X2)S/CU(001) DETERMINED WITH USE OF ANGLE-RESOLVED-PHOTOEMISSION EXTENDED FINE-STRUCTURE [J].
BAHR, CC ;
BARTON, JJ ;
HUSSAIN, Z ;
ROBEY, SW ;
TOBIN, JG ;
SHIRLEY, DA .
PHYSICAL REVIEW B, 1987, 35 (08) :3773-3782
[2]   PHOTOELECTRON HOLOGRAPHY [J].
BARTON, JJ .
PHYSICAL REVIEW LETTERS, 1988, 61 (12) :1356-1359
[3]   REMOVING MULTIPLE-SCATTERING AND TWIN IMAGES FROM HOLOGRAPHIC IMAGES [J].
BARTON, JJ .
PHYSICAL REVIEW LETTERS, 1991, 67 (22) :3106-3109
[4]   DIRECT SURFACE-STRUCTURE DETERMINATION WITH PHOTOELECTRON DIFFRACTION [J].
BARTON, JJ ;
BAHR, CC ;
HUSSAIN, Z ;
ROBEY, SW ;
TOBIN, JG ;
KLEBANOFF, LE ;
SHIRLEY, DA .
PHYSICAL REVIEW LETTERS, 1983, 51 (04) :272-275
[5]  
BARTON JJ, 1991, STRUCTURE SURFACE, V3
[6]   EPITAXIAL FILM CRYSTALLOGRAPHY BY HIGH-ENERGY AUGER AND X-RAY PHOTOELECTRON DIFFRACTION [J].
CHAMBERS, SA .
ADVANCES IN PHYSICS, 1991, 40 (04) :357-415
[7]   ELASTIC-SCATTERING AND INTERFERENCE OF BACKSCATTERED PRIMARY, AUGER AND X-RAY PHOTOELECTRONS AT HIGH KINETIC-ENERGY - PRINCIPLES AND APPLICATIONS [J].
CHAMBERS, SA .
SURFACE SCIENCE REPORTS, 1992, 16 (06) :261-331
[8]   NUCLEATION AND GROWTH OF ULTRATHIN FE AND AU FILMS ON CU(100) STUDIED BY SCANNING TUNNELING MICROSCOPY [J].
CHAMBLISS, DD ;
WILSON, RJ ;
CHIANG, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1992, 10 (04) :1993-1998
[9]   CONDENSED PHASE PHOTOELECTRON ASYMMETRY [J].
DAVIS, RF ;
KEVAN, SD ;
LU, BC ;
TOBIN, JG ;
SHIRLEY, DA .
CHEMICAL PHYSICS LETTERS, 1980, 71 (03) :448-451
[10]  
DIPEL R, 1992, PHYS REV LETT, V68, P1543