SILICON DIODE DOSIMETRY

被引:33
作者
DIXON, RL
EKSTRAND, KE
机构
来源
INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES | 1982年 / 33卷 / 11期
关键词
D O I
10.1016/0020-708X(82)90242-3
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
引用
收藏
页码:1171 / 1176
页数:6
相关论文
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