ON THE EFFECT OF AMBIENTS ON THE FORMATION OF OXYGEN-RELATED DONORS IN CZ-SI

被引:3
作者
SCHMALZ, K
GAWORZEWSKI, P
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 78卷 / 02期
关键词
D O I
10.1002/pssa.2210780258
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:K141 / K145
页数:5
相关论文
共 9 条
[1]   OXYGEN-RELATED DONORS FORMED AT 600-DEGREES-C IN SILICON IN DEPENDENCE ON OXYGEN AND CARBON CONTENT [J].
GAWORZEWSKI, P ;
SCHMALZ, K .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 77 (02) :571-582
[2]   ON THE KINETICS OF THERMAL DONORS IN OXYGEN-RICH SILICON IN THE RANGE FROM 450-DEGREES-C TO 900-DEGREES-C [J].
GAWORZEWSKI, P ;
SCHMALZ, K .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 58 (02) :K223-K226
[3]  
GOSELE U, 1983, UNPUB DEFECTS SEMICO
[4]   DETERMINATION OF PARTS PER BILLION OXYGEN IN SILICON THROUGH CALIBRATION OF IR-ABSORPTION AT 77 DEGREES KELVIN [J].
GRAFF, K ;
GRALLATH, E ;
ADES, S ;
GOLDBACH, G ;
TOLG, G .
SOLID-STATE ELECTRONICS, 1973, 16 (08) :887-893
[5]   EFFECTS OF AMBIENTS ON OXYGEN PRECIPITATION IN SILICON [J].
HU, SM .
APPLIED PHYSICS LETTERS, 1980, 36 (07) :561-564
[6]   COMPARISON OF 2 KINDS OF OXYGEN DONORS IN SILICON BY RESISTIVITY MEASUREMENTS [J].
KANAMORI, A ;
KANAMORI, M .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) :8095-8101
[7]   THERMALLY INDUCED MICRODEFECTS IN CZOCHRALSKI-GROWN SILICON - NUCLEATION AND GROWTH-BEHAVIOR [J].
KISHINO, S ;
MATSUSHITA, Y ;
KANAMORI, M ;
IIZUKA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1982, 21 (01) :1-12
[8]  
NEWMAN RC, 1973, J PHYS CHEM SOLIDS, V26, P887
[9]   ON THE DONOR ACTIVITY OF OXYGEN IN SILICON AT TEMPERATURES FROM 500 TO 800-DEGREES-C [J].
SCHMALZ, K ;
GAWORZEWSKI, P .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 64 (01) :151-158