MEASUREMENTS IN MILLIMETER TO MICRON RANGE

被引：8

作者：

FELLERS, RG

机构：

来源：

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1967年 / 55卷 / 06期

关键词：

D O I：

10.1109/PROC.1967.5714

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1003 / +

页数：1

共 37 条

[1]

Barnes C. E., 1961, IEEE T MICROW THEORY, V9, P519

[2]

BEYER JB, 1963, IEEE T MICROW THEORY, VMT11, P18

[3]

BYRNE JF, 1963, IEEE T MICROW THEORY, VMT11, P379

[4]

COLEMAN PD, 1963, IEEE T MICROW THEORY, V11, P271

[5]

Culshaw W., 1960, IRE T MICROWAVE THEO, V8, P182, DOI DOI 10.1109/TMTT.1960.1124721

[6]

Culshaw W., 1961, IRE T MICROW THEORY, V9, P135

DEGENFORD, JE ;

COLEMAN, PD .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (04) :520-+

[8] REFLECTING BEAM WAVEGUIDE [J].

DEGENFORD, JE ;

STEIER, WH ;

SIRKIS, MD .

[9] INTERNAL REFLECTIONS IN DIELECTRIC PRISMS [J].

FELLERS, RG ;

TAYLOR, J .

[10]

FELLERS RG, 1963, IEEE T INSTRUMENTATI, VIM12, P139