INSITU SCANNING TUNNELING MICROSCOPY AT POTENTIAL CONTROLLED AG(100) SUBSTRATES

被引:80
作者
CHRISTOPH, R [1 ]
SIEGENTHALER, H [1 ]
ROHRER, H [1 ]
WIESE, H [1 ]
机构
[1] ZURICH RES LAB,IBM RES DIV,CH-8803 RUSCHLIKON,SWITZERLAND
关键词
D O I
10.1016/0013-4686(89)87134-8
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1011 / 1022
页数:12
相关论文
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