学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
DIRECT MEASUREMENT OF THE AVAILABLE VOLTAGE GAIN OF BIPOLAR AND FIELD-EFFECT TRANSISTORS
被引:1
作者
:
JAEGER, RC
论文数:
0
引用数:
0
h-index:
0
JAEGER, RC
DANESHVAR, K
论文数:
0
引用数:
0
h-index:
0
DANESHVAR, K
FOX, RM
论文数:
0
引用数:
0
h-index:
0
FOX, RM
DILLARD, WC
论文数:
0
引用数:
0
h-index:
0
DILLARD, WC
机构
:
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1985年
/ 6卷
/ 05期
关键词
:
D O I
:
10.1109/EDL.1985.26103
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:219 / 220
页数:2
相关论文
共 6 条
[1]
GRAY PR, 1980, ANALOG MOS INTEGRATE, P28
[2]
LOW-FREQUENCY INCREMENTAL COLLECTOR OUTPUT RESISTANCE OF A BIPOLAR JUNCTION TRANSISTOR
[J].
HART, BL
论文数:
0
引用数:
0
h-index:
0
HART, BL
.
INTERNATIONAL JOURNAL OF ELECTRICAL ENGINEERING EDUCATION,
1981,
18
(03)
:257
-265
[3]
EARLY VOLTAGE UNIQUENESS TEST FOR BIPOLAR JUNCTION TRANSISTORS
[J].
HART, BL
论文数:
0
引用数:
0
h-index:
0
HART, BL
.
ELECTRONICS LETTERS,
1980,
16
(18)
:703
-705
[4]
PERFORMANCE OF DIFFERENTIAL CASCODE AMPLIFIER
[J].
JAEGER, RC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, BOCA RATON, FL 33432 USA
IBM CORP, BOCA RATON, FL 33432 USA
JAEGER, RC
;
HELLWARTH, GA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, BOCA RATON, FL 33432 USA
IBM CORP, BOCA RATON, FL 33432 USA
HELLWARTH, GA
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1973,
SC 8
(02)
:169
-174
[5]
SELF-CONSISTENT BIPOLAR-TRANSISTOR MODELS FOR COMPUTER-SIMULATION
[J].
JAEGER, RC
论文数:
0
引用数:
0
h-index:
0
机构:
VANDERBILT UNIV,DEPT ELECT ENGN,NASHVILLE,TN 37235
VANDERBILT UNIV,DEPT ELECT ENGN,NASHVILLE,TN 37235
JAEGER, RC
;
BRODERSEN, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
VANDERBILT UNIV,DEPT ELECT ENGN,NASHVILLE,TN 37235
VANDERBILT UNIV,DEPT ELECT ENGN,NASHVILLE,TN 37235
BRODERSEN, AJ
.
SOLID-STATE ELECTRONICS,
1978,
21
(10)
:1269
-1272
[6]
COMMON-MODE REJECTION LIMITATIONS OF DIFFERENTIAL-AMPLIFIERS
[J].
JAEGER, RC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
JAEGER, RC
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1976,
11
(03)
:411
-417
←
1
→
共 6 条
[1]
GRAY PR, 1980, ANALOG MOS INTEGRATE, P28
[2]
LOW-FREQUENCY INCREMENTAL COLLECTOR OUTPUT RESISTANCE OF A BIPOLAR JUNCTION TRANSISTOR
[J].
HART, BL
论文数:
0
引用数:
0
h-index:
0
HART, BL
.
INTERNATIONAL JOURNAL OF ELECTRICAL ENGINEERING EDUCATION,
1981,
18
(03)
:257
-265
[3]
EARLY VOLTAGE UNIQUENESS TEST FOR BIPOLAR JUNCTION TRANSISTORS
[J].
HART, BL
论文数:
0
引用数:
0
h-index:
0
HART, BL
.
ELECTRONICS LETTERS,
1980,
16
(18)
:703
-705
[4]
PERFORMANCE OF DIFFERENTIAL CASCODE AMPLIFIER
[J].
JAEGER, RC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, BOCA RATON, FL 33432 USA
IBM CORP, BOCA RATON, FL 33432 USA
JAEGER, RC
;
HELLWARTH, GA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, BOCA RATON, FL 33432 USA
IBM CORP, BOCA RATON, FL 33432 USA
HELLWARTH, GA
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1973,
SC 8
(02)
:169
-174
[5]
SELF-CONSISTENT BIPOLAR-TRANSISTOR MODELS FOR COMPUTER-SIMULATION
[J].
JAEGER, RC
论文数:
0
引用数:
0
h-index:
0
机构:
VANDERBILT UNIV,DEPT ELECT ENGN,NASHVILLE,TN 37235
VANDERBILT UNIV,DEPT ELECT ENGN,NASHVILLE,TN 37235
JAEGER, RC
;
BRODERSEN, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
VANDERBILT UNIV,DEPT ELECT ENGN,NASHVILLE,TN 37235
VANDERBILT UNIV,DEPT ELECT ENGN,NASHVILLE,TN 37235
BRODERSEN, AJ
.
SOLID-STATE ELECTRONICS,
1978,
21
(10)
:1269
-1272
[6]
COMMON-MODE REJECTION LIMITATIONS OF DIFFERENTIAL-AMPLIFIERS
[J].
JAEGER, RC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
JAEGER, RC
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1976,
11
(03)
:411
-417
←
1
→