DIRECT MEASUREMENT OF THE AVAILABLE VOLTAGE GAIN OF BIPOLAR AND FIELD-EFFECT TRANSISTORS

被引:1
作者
JAEGER, RC
DANESHVAR, K
FOX, RM
DILLARD, WC
机构
关键词
D O I
10.1109/EDL.1985.26103
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:219 / 220
页数:2
相关论文
共 6 条
[1]  
GRAY PR, 1980, ANALOG MOS INTEGRATE, P28
[3]   EARLY VOLTAGE UNIQUENESS TEST FOR BIPOLAR JUNCTION TRANSISTORS [J].
HART, BL .
ELECTRONICS LETTERS, 1980, 16 (18) :703-705
[4]   PERFORMANCE OF DIFFERENTIAL CASCODE AMPLIFIER [J].
JAEGER, RC ;
HELLWARTH, GA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1973, SC 8 (02) :169-174
[5]   SELF-CONSISTENT BIPOLAR-TRANSISTOR MODELS FOR COMPUTER-SIMULATION [J].
JAEGER, RC ;
BRODERSEN, AJ .
SOLID-STATE ELECTRONICS, 1978, 21 (10) :1269-1272
[6]   COMMON-MODE REJECTION LIMITATIONS OF DIFFERENTIAL-AMPLIFIERS [J].
JAEGER, RC .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1976, 11 (03) :411-417