POLARIZATION ANALYZING SYSTEM FOR X-RAY MAGNETIC KERR ROTATION IN X-RAY MAGNETIC RESONANT SCATTERING

被引：5

作者：

MORI, K

NAMIKAWA, K

FUNAHASHI, Y

HIGASHI, Y

ANDO, M

机构：

[1] TOKYO GAKUGEI UNIV,DEPT PHYS,KOGANEI,TOKYO 184,JAPAN

[2] KEK,CTR MECH ENGN,TSUKUBA,IBARAKI 305,JAPAN

[3] GRAD UNIV ADV STUDIES,DEPT SYNCHROTRON RADIAT SCI,TSUKUBA,IBARAKI 305,JAPAN

[4] GRAD UNIV ADV STUDIES,KEK,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 07期

关键词：

D O I：

10.1063/1.1144453

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We made a new polarization analyzing system for measuring a rotation of major axis of elliptical polarization in x-ray magnetic resonant scattering. This system, based on a two-axis diffractometer, is characterized by introducing a 45-degrees linearly polarized x-ray incident beam. Design and performance of the system are described. The rotation can be measured with precision of 0.2-degrees-0.3-degrees at the vicinity of Gd L3-absorption edge where the maximum rotation is about -2-degrees.

引用

页码：1825 / 1830

页数：6

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