CAVITY PHASE-SHIFT METHOD FOR HIGH REFLECTANCE MEASUREMENTS AT MID-INFRARED WAVELENGTHS

被引：11

作者：

KWOK, MA

HERBELIN, JM

UEUNTEN, RH

机构：

来源：

OPTICAL ENGINEERING | 1982年 / 21卷 / 06期

关键词：

D O I：

10.1117/12.7973018

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2. 9 micrometers wavelength is described. A reflectance of 0. 9920 plus or minus 0. 0050 has been measured. 7 refs.

引用

页码：979 / 982

页数：4

共 7 条

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