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SIMPLE METHOD FOR DETERMINATION OF THE INTERFACE TRAP DENSITY AT THE MIDGAP IN MOS STRUCTURES

被引：5
作者：
JAKUBOWSKI, A
INIEWSKI, K
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1982年 / 73卷 / 02期
关键词：
D O I：
10.1002/pssa.2210730230
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：545 / 549
页数：5
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