DIGITAL QUARTZ DEPOSITION MONITOR USING A MICROPROCESSOR

被引:7
作者
HAMMER, D
BENES, E
PULKER, HK
机构
[1] TECH UNIV VIENNA,INST ALLGEMEINE PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
[2] BALZERS AG HOCHVAKUUM TECH & DUNNE SCHICHTEN,GRUNDLAGENENTWICKLUNG,FL9496 BALZERS,LIECHTENSTEIN
关键词
D O I
10.1016/0040-6090(76)90552-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:47 / 50
页数:4
相关论文
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[2]   INVESTIGATION OF FILM-THICKNESS DETERMINATION BY OSCILLATING QUARTZ RESONATORS WITH LARGE MASS LOAD [J].
LU, CS ;
LEWIS, O .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (11) :4385-&