RAMAN-SCATTERING IN GALLIUM SELENIDE AND SULFIDE FILMS

被引:11
作者
IBRAGIMOV, TD [1 ]
KURBANOVA, GG [1 ]
GORELIK, VS [1 ]
机构
[1] PN LEBEDEV PHYS INST, MOSCOW 117333, USSR
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 1989年 / 155卷 / 01期
关键词
D O I
10.1002/pssb.2221550109
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:113 / 116
页数:4
相关论文
共 23 条
[1]  
ABDULLAEV GB, 1979, FIZ TVERD TELA+, V21, P910
[2]   ELECTRONIC AND VIBRATIONAL-SPECTRA OF THE A3B6 LAYERED SEMICONDUCTORS [J].
BELENKII, GL ;
STOPACHINSKII, VB .
USPEKHI FIZICHESKIKH NAUK, 1983, 140 (02) :233-270
[3]  
BRYKSIN VV, 1974, USP FIZ NAUK+, V113, P29, DOI 10.1070/PU1974v017n03ABEH004133
[4]  
BURLAKOV VM, 1979, FIZ TVERD TELA+, V21, P2563
[5]   STRESS-INDUCED SHIFTS OF FIRST-ORDER RAMAN FREQUENCIES OF DIAMOND AND ZINC-BLENDE-TYPE SEMICONDUCTORS [J].
CERDEIRA, F ;
BUCHENAUER, CJ ;
CARDONA, M ;
POLLAK, FH .
PHYSICAL REVIEW B-SOLID STATE, 1972, 5 (02) :580-+
[6]  
CLOCHIKHIN AA, 1976, FIZ TVERD TELA, V18, P2238
[7]   DETERMINATION OF EXISTING STRESS IN SILICON FILMS ON SAPPHIRE SUBSTRATE USING RAMAN-SPECTROSCOPY [J].
ENGLERT, T ;
ABSTREITER, G ;
PONTCHARRA, J .
SOLID-STATE ELECTRONICS, 1980, 23 (01) :31-33
[8]  
Fisher G., 1963, HELV PHYS ACTA, V36, P317
[9]  
GAMASSEL J, 1976, SOLID STATE COMMUN, V19, P483
[10]  
GORELIK VS, 1984, SOVIET PHYS, V6, P18