EPSILON-SCANNING - A METHOD OF EVALUATING THE DIMENSIONAL AND ORIENTATIONAL DISTRIBUTION OF CRYSTALLITES BY X-RAY-POWDER DIFFRACTOMETER

被引：15

作者：

YUKINO, K ^{[1
]}

UNO, R ^{[1
]}

机构：

[1] NIHON UNIV,COLL HUMANITIES & SCI,DEPT PHYS,SETAGAYA KU,TOKYO 156,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1986年 / 25卷 / 05期

关键词：

D O I：

10.1143/JJAP.25.661

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：661 / 666

页数：6

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[5]

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[6]

PARRISH W, 1958, ADV XRAY DIFFRACTOME

[7]

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[10]

UNO R, 1970, J PHYS SOC JPN, V19, P437