SURFACE COMPOSITION AND CHEMISTRY OF EVAPORATED PERMALLOY-FILMS OBSERVED BY X-RAY PHOTOEMISSION SPECTROSCOPY AND BY AUGER-ELECTRON SPECTROSCOPY

被引：35

作者：

POLLAK, RA ^{[1
]}

BAJOREK, CH ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

关键词：

D O I：

10.1063/1.321736

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1382 / 1388

页数：7

共 15 条

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[2] ANOMALOUS LOW-TEMPERATURE FERROMAGNETIC-RESONANCE BEHAVIOR OF THIN PERMALLOY-FILMS
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WILTS, CH
[J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) : 1376 - 1381
[3] Carlson T. A., 1972, Journal of Electron Spectroscopy and Related Phenomena, V1, P161, DOI 10.1016/0368-2048(72)80029-X
[4] CARLSON TA, 1970, ORNL4614 OAK RIDG NA
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[6] CHEMICAL EFFECTS IN AUGER-ELECTRON SPECTROSCOPY
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[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) : 1853 - &
[7] HAMRIN K, 1970, J PHYS CHEM SOLIDS, V31, P31
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[9] Hauffe K., 1965, OXID MET
[10] Kim K.S., 1972, J ELECTRON SPECTROSC, V1, P251, DOI [DOI 10.1016/0368-2048(72)85014-X, DOI 10.1016/S0368-2048(01)00249-3]