PHOTOELECTRON-DIFFRACTION ANALYSIS OF THE STRUCTURE OF C(2X2)O ON NI(001)

被引：36

作者：

TONG, SY

KANG, WM

ROSENBLATT, DH

TOBIN, JG

SHIRLEY, DA

机构：

[1] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201

[2] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720

[3] UNIV CALIF BERKELEY,DEPT CHEM,BERKELEY,CA 94720

来源：

PHYSICAL REVIEW B | 1983年 / 27卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.27.4632

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：4632 / 4636

页数：5

共 18 条

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[10] NORMAL PHOTOELECTRON DIFFRACTION OF C(2X2)O(1S)-NI(001) AND C(2X2)S(2P)-NI(001), WITH FOURIER-TRANSFORM ANALYSIS [J].

ROSENBLATT, DH ;

TOBIN, JG ;

MASON, MG ;

DAVIS, RF ;

KEVAN, SD ;

SHIRLEY, DA ;

LI, CH ;

TONG, SY .

PHYSICAL REVIEW B, 1981, 23 (08) :3828-3835

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