CUMULATIVE DISORDER AND X-RAY-LINE BROADENING IN MULTILAYERS

被引：129

作者：

SEVENHANS, W ^{[1
]}

GIJS, M ^{[1
]}

BRUYNSERAEDE, Y ^{[1
]}

HOMMA, H ^{[1
]}

SCHULLER, IK ^{[1
]}

机构：

[1] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439

来源：

PHYSICAL REVIEW B | 1986年 / 34卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.34.5955

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5955 / 5958

页数：4

共 15 条

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[4] GUINIER A, 1963, XRAY DIFFRACTION CRY, P186
[5] KLUG HP, 1974, XRAY DIFFRACTION PRO, P144
[6] MAGNETIC-STRUCTURE OF MULTIPLE BILAYERS OF THIN-FILMS OF FE AND GE
MAJKRZAK, CF
AXE, JD
BONI, P
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) : 3657 - 3659
[7] MCWHAN DB, 1985, SYNTHETIC MODULATED, pCH3
[8] MCWHAN DB, 1983, J APPL PHYS, V54, P7
[9] SUPERCONDUCTING PROPERTIES OF NB/GE METAL-SEMICONDUCTOR MULTILAYERS
RUGGIERO, ST
BARBEE, TW
BEASLEY, MR
[J]. PHYSICAL REVIEW B, 1982, 26 (09) : 4894 - 4908
[10] NEW CLASS OF LAYERED MATERIALS
SCHULLER, IK
[J]. PHYSICAL REVIEW LETTERS, 1980, 44 (24) : 1597 - 1600