PROSPECTS FOR HIGH-RESOLUTION ELECTRON ENERGY-LOSS EXPERIMENTS WITH THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：10

作者：

BATSON, PE

机构：

[1] IBM, Thomas J. Watson Research Cent,, Yorktown Heights, NY, USA, IBM, Thomas J. Watson Research Cent, Yorktown Heights, NY, USA

来源：

ULTRAMICROSCOPY | 1985年 / 18卷 / 1-4期

关键词：

D O I：

10.1016/0304-3991(85)90129-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：125 / 129

页数：5

共 12 条

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[9] STUDY OF THE L23 EDGES IN THE 3D TRANSITION-METALS AND THEIR OXIDES BY ELECTRON-ENERGY-LOSS SPECTROSCOPY WITH COMPARISONS TO THEORY [J].

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FEJES, PL .

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[10] FIELD-EMISSION STUDIES OF ELECTRONIC ENERGY LEVELS OF ADSORBED ATOMS [J].

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