PREDICTION OF AUGER BACKSCATTERING FACTORS FROM MEASUREMENTS OF SPECTRAL BACKGROUNDS

被引:10
作者
PRUTTON, M
ELGOMATI, MM
机构
关键词
D O I
10.1002/sia.740090204
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:99 / 103
页数:5
相关论文
共 25 条
[1]  
BISHOP HE, 1969, J APPL PHY, V40, P1970
[3]  
ELGOMATI MM, 1979, SURF SCI, V72, P486
[4]  
ELGOMATI MM, 1981, SCANNING ELECTRON MI, V3, P1101
[5]   SIMPLE THEORY CONCERNING THE REFLECTION OF ELECTRONS FROM SOLIDS [J].
EVERHART, TE .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (08) :1483-1490
[6]  
FATHERS DJ, 1979, SCANNING ELECTRON MI, V1, P55
[7]  
GALLON TE, 1982, J PHYS D, V5, P822
[8]   BACKSCATTERING CROSS-SECTIONS FOR IONIZATION OF SURFACE-ATOM K SHELLS BY ELECTRON-IMPACT [J].
GERLACH, RL ;
DUCHARME, AR .
PHYSICAL REVIEW A, 1972, 6 (05) :1892-&
[9]   AUGER AND SECONDARY ELECTRONS EXCITED BY BACKSCATTERED ELECTRONS - APPROACH TO QUANTITATIVE-ANALYSIS [J].
GOTO, K ;
ISHIKAWA, K ;
KOSHIKAWA, T ;
SHIMIZU, R .
SURFACE SCIENCE, 1975, 47 (02) :477-494
[10]   REFLECTION AND TRANSMISSION AUGER ANALYSIS OF THIN CARBON-FILMS [J].
GRAMARI, D ;
CAZAUX, J .
SURFACE SCIENCE, 1984, 136 (2-3) :296-306