EVALUATION OF LINE AND CONTINUUM SOURCES FOR ATOMIC FLUORESCENCE SPECTROMETRY USING A LOW-POWERED ARGON MICROWAVE-INDUCED PLASMA

被引：18

作者：

PERKINS, LD ^{[1
]}

LONG, GL ^{[1
]}

机构：

[1] VIRGINIA POLYTECH INST & STATE UNIV,DEPT CHEM,BLACKSBURG,VA 24061

来源：

APPLIED SPECTROSCOPY | 1988年 / 42卷 / 07期

关键词：

D O I：

10.1366/0003702884430083

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1285 / 1289

页数：5

共 14 条

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[7] CHARACTERIZATION OF A MODERATE-POWER MICROWAVE-INDUCED PLASMA FOR DIRECT SOLUTION NEBULIZATION OF METAL-IONS [J].

HAAS, DL ;

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ANALYTICAL CHEMISTRY, 1984, 56 (12) :2014-2019

[8] GLASS FRIT NEBULIZER FOR ATOMIC SPECTROMETRY [J].

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[9] DIRECT INTRODUCTION OF AQUEOUS SAMPLES INTO A LOW-POWERED MICROWAVE-INDUCED PLASMA FOR ATOMIC EMISSION-SPECTROMETRY [J].

LONG, GL ;

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APPLIED SPECTROSCOPY, 1987, 41 (06) :980-985

[10]

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