CHARACTERIZATION OF TUNNEL DIODE PERFORMANCE IN TERMS OF DEVICE FIGURE OF MERIT AND CIRCUIT TIME CONSTANT

被引：9

作者：

ESAKI, L

机构：

来源：

关键词：

D O I：

10.1147/rd.62.0170

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：170 / 178

页数：9

共 8 条

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