A COMPARISON OF 2 ANGULAR DEPENDENT ESCA ALGORITHMS USEFUL FOR CONSTRUCTING DEPTH PROFILES OF SURFACES

被引：57

作者：

YIH, RS

RATNER, BD

机构：

[1] UNIV WASHINGTON,DEPT CHEM ENGN,BF-10,SEATTLE,WA 98195

[2] UNIV WASHINGTON,CTR BIOENGN,SEATTLE,WA 98195

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1987年 / 43卷 / 01期

关键词：

D O I：

10.1016/0368-2048(87)80019-1

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：61 / 82

页数：22

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