CHARACTERIZATION OF THIN ZINC-RICH AND OXYGEN-RICH ZINC-OXIDE LAYERS

被引：17

作者：

GRUNZE, M ^{[1
]}

HIRSCHWALD, W ^{[1
]}

THULL, E ^{[1
]}

机构：

[1] FREE UNIV BERLIN,INST PHYS CHEM,D-1000 BERLIN 33,FED REP GER

来源：

关键词：

D O I：

10.1016/0040-6090(76)90605-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：351 / 356

页数：6

共 7 条

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[3] KINETICS OF THERMAL DISSOCIATION OF ZINC OXIDE
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[J]. ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-FRANKFURT, 1972, 77 (1-6): : 21 - +
[4] HIRSCHWALD W, 1962, Z ELEKTROCHEM, V66, P29
[5] ELECTRON-SPIN RESONANCE OF LATTICE-DEFECTS IN ZINC-OXIDE
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[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 24 (02): : 637 - 648
[6] SAUCIER KM, 1966, J CATAL, V5, P314
[7] THERMOLUMINESCENCE OF ZNO
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[J]. MATERIALS RESEARCH BULLETIN, 1971, 6 (04) : 275 - &