CHARACTERIZATION AND USE OF THE SILICON INTENSIFIED TARGET VIDICON DETECTOR IN BASIC AND APPLIED-RESEARCH IN ATOMIC SPECTROSCOPY

被引:9
作者
OLESIK, JW [1 ]
WALTERS, JP [1 ]
机构
[1] UNIV WISCONSIN,DEPT CHEM,MADISON,WI 53706
关键词
D O I
10.1366/0003702844555089
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:578 / 585
页数:8
相关论文
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