HIGH-FREQUENCY MAGNETIC MEASUREMENTS USING SMALL INDUCTIVE PROBES

被引：10

作者：

BEIERSDORFER, P ^{[1
]}

CLOTHIAUX, EJ ^{[1
]}

机构：

[1] AUBURN UNIV,DEPT PHYS,AUBURN,AL 36849

来源：

AMERICAN JOURNAL OF PHYSICS | 1983年 / 51卷 / 11期

关键词：

D O I：

10.1119/1.13444

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

引用

页码：1031 / 1036

页数：6

共 10 条

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[2]

BOTTICHER W, 1968, PLASMA DIAGNOSTICS

[3]

GROVER IW, 1946, INDUCTANCE CALCULATI, P143

[4]

IGNAT DW, 1973, REV SCI INSTRUM, V44, P980

[5]

JONES B, 1974, CIRCUIT ELECTRONICS, P115

[6]

Lovberg R. H., 1965, PLASMA DIAGNOSTIC TE

[7] CONSTRUCTION AND CALIBRATION TECHNIQUES OF HIGH FREQUENCY MAGNETIC PROBES [J].

PHILLIPS, RC ;

TURNER, EB .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (12) :1822-&

[8]

REITZ JR, 1979, FDN ELECTROMAGNETIC, P168

[9] MAGNETIC PROBES OF HIGH FREQUENCY RESPONSE [J].

SEGRE, SE ;

ALLEN, JE .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (10) :369-371

[10] PROBE FOR MEASUREMENT OF MAGNETIC-FIELDS WITH SUB-NANOSECOND RESOLUTION [J].

SEROV, R ;

RICHARDSON, MC ;

BURTYN, P .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (07) :886-888

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