X-RAY-DIFFRACTION AND ION BACKSCATTERING STUDY OF THERMALLY ANNEALED PD/SIC AND NI/SIC

被引：68

作者：

PAI, CS

HANSON, CM

LAU, SS

机构：

来源：

关键词：

D O I：

10.1063/1.334749

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：618 / 619

页数：2

共 8 条

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