RIETVELD REFINEMENT OF DEBYE-SCHERRER SYNCHROTRON X-RAY DATA FROM AL2O3

被引：2581

作者：

THOMPSON, P

COX, DE

HASTINGS, JB

机构：

[1] Brookhaven National Laboratory, Upton,NY,11973, United States

来源：

关键词：

D O I：

10.1107/S0021889887087090

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Rietveld refinement

引用

页码：79 / 83

页数：5

共 25 条

[1] SAGITTAL FOCUSING OF SYNCHROTRON RADIATION
BATTERMAN, BW
BERMAN, L
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3): : 327 - 331
[2] Buras B, 1981, HASYLAB JAHRESBERICH, P101
[3] CALVERT LD, 1981, ACTA CRYSTALLOGR A, V37, pC314
[4] CHRISTENSEN AN, 1985, AUST J PHYS, V38, P497
[5] APPLICATION OF SYNCHROTRON RADIATION TO HIGH-RESOLUTION POWDER DIFFRACTION AND RIETVELD REFINEMENT
COX, DE
HASTINGS, JB
THOMLINSON, W
PREWITT, CT
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3): : 573 - 578
[6] COX DE, 1980, NBS SPEC PUBL, V567, P189
[7] SYNCHROTRON X-RAY-POWDER DIFFRACTION
HASTINGS, JB
THOMLINSON, W
COX, DE
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (APR) : 85 - 95
[8] ABSORPTION CORRECTIONS FOR NEUTRON-DIFFRACTION
HEWAT, AW
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1979, 35 (JAN): : 248 - 248
[9] KEIJSER TH, 1982, J APPL CRYSTALLOGR, V15, P308
[10] PROFILE ANALYSIS OF X-RAY POWDER DIFFRACTOMETER DATA - STRUCTURAL REFINEMENT OF LA0.75SR0.25CRO3
KHATTAK, CP
COX, DE
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (OCT1) : 405 - 411