DETERMINATION OF THE STRUCTURE FACTORS OF CU AND CU3AU BY THE INTERSECTING KIKUCHI-LINE METHOD

被引:20
作者
MATSUHATA, H [1 ]
TOMOKIYO, Y [1 ]
WATANABE, H [1 ]
EGUCHI, T [1 ]
机构
[1] KYUSHU UNIV,HVEM LAB,FUKUOKA 812,JAPAN
来源
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE | 1984年 / 40卷 / DEC期
关键词
D O I
10.1107/S0108768184002664
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:544 / 549
页数:6
相关论文
共 16 条
[1]   AN APPROXIMATE THEORY OF ORDER IN ALLOYS [J].
COWLEY, JM .
PHYSICAL REVIEW, 1950, 77 (05) :669-675
[2]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[4]   ELECTRON DIFFRACTION STUDY OF MGO HOO SYSTEMATIC INTERACTIONS [J].
GOODMAN, P ;
LEHMPFUHL, G .
ACTA CRYSTALLOGRAPHICA, 1967, 22 :14-+
[5]   DETERMINATION OF INTERSTITIAL CONCENTRATION OF V IN DISORDERED VO1.23 BY AN INTERSECTING KIKUCHI-LINE METHOD [J].
HOIER, R ;
ANDERSSON, B .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1974, A 30 (JAN1) :93-+
[6]   ABSORPTION PARAMETERS IN ELECTRON DIFFRACTION THEORY [J].
HUMPHREYS, CJ ;
HIRSCH, PB .
PHILOSOPHICAL MAGAZINE, 1968, 18 (151) :115-+
[7]   METHOD OF DETERMINING ORDER PARAMETER FROM THICKNESS FRINGES IN ELECTRON-MICROGRAPHS [J].
KINOSHITA, C ;
MUKAI, T ;
KITAJIMA, S .
ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JUL1) :605-609
[8]   CRITICAL VOLTAGE EFFECT IN CU-BASED ALLOYS CONTAINING AL OR AU [J].
KURODA, K ;
TOMOKIYO, Y ;
EGUCHI, T .
TRANSACTIONS OF THE JAPAN INSTITUTE OF METALS, 1981, 22 (08) :535-542
[9]   222 ELECTRON REFLECTION FROM ALUMINIUM AND SYSTEMATIC INTERACTION [J].
NAGATA, F ;
FUKUHARA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1967, 6 (10) :1233-&
[10]   NATURE OF LONG-RANGE ORDER IN CU3AU AND CU72AU28 [J].
SCHWARTZ, LH ;
COHEN, JB .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (02) :598-&