ROUGH-SURFACE RETRIEVAL FROM THE SPECULAR INTENSITY OF MULTIPLY SCATTERED WAVES

被引:13
作者
GARCIA, N [1 ]
NIETOVESPERINAS, M [1 ]
机构
[1] UNIV AUTONOMA MADRID, FAC CIENCIAS C3, CSIC, INST CIENCIA MAT, E-28049 MADRID, SPAIN
关键词
D O I
10.1103/PhysRevLett.71.3645
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We present a solution to the direct determination of the statistical parameters (correlation length and root mean square deviation), characterizing the profile of a random rough surface with large slopes, thus producing multiple scattering. This is done from the specular, coherent, component of the mean intensity of waves scattered from the surface, and, today, is the only reliable, realistic procedure which uses an analytical expression of this component. The method is applicable whenever this specular component may be measured, and is valid for a wide variety of physical problems involving surface scattering.
引用
收藏
页码:3645 / 3648
页数:4
相关论文
共 27 条
[1]  
[Anonymous], 1991, J ACOUST SOC AM
[2]  
Bennett J.M., 1989, INTRO SURFACE ROUGHN
[3]  
BENNETT JM, 1992, SURFACE FINISH ITS M
[4]  
BOENER WM, 1983, INVERSE METHODS ELEC
[5]   THE PHASE PERTURBATION TECHNIQUE VS AN EXACT NUMERICAL-METHOD FOR RANDOM ROUGH-SURFACE SCATTERING [J].
BROSCHAT, SL ;
THORSOS, EI ;
ISHIMARU, A .
JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 1989, 3 (03) :237-256
[6]  
DAINTY JC, 1991, MODERN TRENDS OPTICS
[7]  
DESANTO JA, 1989, PROGR OPTICS, V23, P2
[8]  
DESANTO JA, 1990, SCATTERING VOLUMES S
[9]   MONTE-CARLO CALCULATION FOR ELECTROMAGNETIC-WAVE SCATTERING FROM RANDOM ROUGH SURFACES [J].
GARCIA, N ;
STOLL, E .
PHYSICAL REVIEW LETTERS, 1984, 52 (20) :1798-1801
[10]  
GARCIA N, 1978, PHYS REV B, V18, P576, DOI 10.1103/PhysRevB.18.576