ROUGH-SURFACE RETRIEVAL FROM THE SPECULAR INTENSITY OF MULTIPLY SCATTERED WAVES

We present a solution to the direct determination of the statistical parameters (correlation length and root mean square deviation), characterizing the profile of a random rough surface with large slopes, thus producing multiple scattering. This is done from the specular, coherent, component of the mean intensity of waves scattered from the surface, and, today, is the only reliable, realistic procedure which uses an analytical expression of this component. The method is applicable whenever this specular component may be measured, and is valid for a wide variety of physical problems involving surface scattering.