DIRECT OBSERVATION OF FINE-STRUCTURE WITHIN IMAGES OF ATOMS IN CRYSTALS BY TRANSMISSION ELECTRON-MICROSCOPY

被引：62

作者：

HASHIMOTO, H

ENDOH, H

TANJI, T

ONO, A

WATANABE, E

机构：

[1] OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN

[2] JAPAN ELECTR OPT LAB CO,AKISHIMA,TOKYO,JAPAN

来源：

关键词：

D O I：

10.1143/JPSJ.42.1073

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1073 / 1074

页数：2

共 6 条

[1]

FUKUHARA A, 1966, OPTIK, V24, P513

[2]

HANSSEN KJ, 1971, OPTIK, V32, P519

HASHIMOTO, H ;

HOWIE, A ;

WHELAN, MJ .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1962, 269 (1336) :80-&

[4]

HASHIMOTO H, 1975, MICROSCOPIE ELECTRON, P79

[5]

LEHMPFUHL G, 1973, Z NATURFORSCH A, VA 28, P1

[6]

METHERELL AJF, 1970, MICROSCOPIE ELECTRON, V1, P105