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MEASUREMENT OF PERMITTIVITY USING AN OPEN RESONATOR

被引：5
作者：
LYNCH, AC
机构：
来源：
IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY | 1983年 / 130卷 / 07期
关键词：
D O I：
10.1049/ip-a-1.1983.0064
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 [电气工程]; 0809 [电子科学与技术];
摘要：
4
引用
收藏
页码：365 / 368
页数：4
相关论文
共 4 条
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CORRECTION TO OPEN-RESONATOR PERMITTIVITY AND LOSS MEASUREMENTS [J].
COOK, RJ ;
JONES, RG .
ELECTRONICS LETTERS, 1976, 12 (01) :1-2
[2]
ACCURATE MEASUREMENT OF PERMITTIVITY BY MEANS OF AN OPEN RESONATOR [J].
CULLEN, AL ;
YU, PK .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1971, 325 (1563) :493-&
[3]
MICROWAVE OPEN RESONATOR - A PARADOX [J].
LYNCH, AC .
ELECTRONICS LETTERS, 1982, 18 (11) :464-465
[4]
MEASUREMENT OF PERMITTIVITY BY MEANS OF AN OPEN RESONATOR .1. THEORETICAL [J].
YU, PK ;
CULLEN, AL .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1982, 380 (1778) :49-71
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