INVESTIGATION OF SI-FE TRANSFORMER SHEETS BY SCANNING ELECTRON ACOUSTIC MICROSCOPY (SEAM)

被引：21

作者：

BALK, LJ ^{[1
]}

DAVIES, DG ^{[1
]}

KULTSCHER, N ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

关键词：

D O I：

10.1109/TMAG.1984.1063548

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1466 / 1468

页数：3

共 8 条

[1] BALK LJ, 1984, J PHYS-PARIS, V45, P869, DOI 10.1051/jphyscol:19842199
[2] BALK LJ, 1984, PHYS STATUS SOLIDI A, V82, P23, DOI 10.1002/pssa.2210820103
[3] BALK LJ, 1984, UNPUB J SCANNING ELE
[4] BALK LJ, 1983, BEITR ELEKTRONENMIKR, V16, P107
[5] THERMAL-WAVE MICROSCOPY WITH ELECTRON-BEAMS
BRANDIS, E
ROSENCWAIG, A
[J]. APPLIED PHYSICS LETTERS, 1980, 37 (01) : 98 - 100
[6] ULTRASONIC-IMAGING IN SCANNING ELECTRON-MICROSCOPY
CARGILL, GS
[J]. NATURE, 1980, 286 (5774) : 691 - 693
[7] DAVIES DG, 1983, J SCANNING ELECTRON, V2, P1163
[8] SEM STUDIES OF MAGNETIC DOMAINS IN AMORPHOUS RIBBONS
LIVINGSTON, JD
MORRIS, WG
[J]. IEEE TRANSACTIONS ON MAGNETICS, 1981, 17 (06) : 2624 - 2626