THE IMPORTANCE OF BEAM ALIGNMENT AND CRYSTAL TILT IN HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：140

作者：

SMITH, DJ

SAXTON, WO

OKEEFE, MA

WOOD, GJ

STOBBS, WM

机构：

来源：

ULTRAMICROSCOPY | 1983年 / 11卷 / 04期

关键词：

D O I：

10.1016/0304-3991(83)90006-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：263 / 281

页数：19

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